DocumentCode :
2027448
Title :
Comments on Manipulability Measure in Redundant Planar Manipulators
Author :
Martins, Ad.M. ; Dias, Anfranserai M. ; Alsina, Pablo J.
Author_Institution :
Comput. Neuro-Eng. Lab., Florida Univ., Gainesville, FL
fYear :
2006
fDate :
26-27 Oct. 2006
Firstpage :
169
Lastpage :
173
Abstract :
In this paper we perform an analysis of the manipulability matrix of a manipulator in terms of its eigenvalues and eigenvectors (eigen-analysis), which defines the well know manipulability ellipsoid for planar manipulators. We show that the manipulability measure does not depend on the first joint angle, for redundant manipulators. The determinant of manipulability matrix doesn´t change when the first angle varies. So, as we´ll show, the product of the eigenvalues remains the same. The manipulability ellipsoid changes with the first joint angle, but keeps constant the manipulability measure (area of the ellipsoid). We claim that manipulability-control based algorithms must use the eigenvectors and eigenvalues of manipulability matrix independently, in order to be optimal. Some tests show the improvement of the control law when we use directly the eigenvectors as a local basis for the control. Furthermore we suggests that the control analysis should be done not only in the joint space, buy in the manifold spanned by the Manipulability matrix M, that should lead to naturally simple control laws that uses the optimal freedom in the joint space
Keywords :
control system analysis; eigenvalues and eigenfunctions; matrix algebra; redundant manipulators; control analysis; control law; eigen-analysis; eigenvalues and eigenvectors; manipulability ellipsoid; manipulability matrix; manipulability measure; optimal freedom; redundant planar manipulators; Eigenvalues and eigenfunctions; Ellipsoids; Gain measurement; Jacobian matrices; Laboratories; Manipulators; Neural engineering; Optimal control; Robot kinematics; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics Symposium, 2006. LARS '06. IEEE 3rd Latin American
Conference_Location :
Santiago
Print_ISBN :
1-4244-0537-8
Electronic_ISBN :
1-4244-0537-8
Type :
conf
DOI :
10.1109/LARS.2006.334333
Filename :
4133835
Link To Document :
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