DocumentCode :
20276
Title :
Silicon Carbide (SiC) Nanoelectromechanical Antifuse for Ultralow-Power One-Time-Programmable (OTP) FPGA Interconnects
Author :
Tina He ; Fengchao Zhang ; Bhunia, Swarup ; Feng, Philip X.-L
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
Volume :
3
Issue :
4
fYear :
2015
fDate :
Jul-15
Firstpage :
323
Lastpage :
335
Abstract :
We report a new nanoscale antifuse featuring low-power and high-programming speed, by employing silicon carbide (SiC) nanoelectromechanical systems (NEMS). We show that the SiC NEMS antifuses can enable ultralow-power one-time-programmable (OTP) field-programmable gate arrays (FPGAs) with characteristics promising for security-sensitive and harsh-environment applications. The SiC NEMS antifuses offer minimal leakage, low-programming voltage (down to ~1.5 V), ideally abrupt transient, high on/off ratios (>107) and high-current carrying ability (>106 A/cm2), and very small footprints (~1 μm2 to ~0.1 μm2 per device). We further describe new designs of antifuses, simulate FPGA benchmarking circuits based on experimentally demonstrated practical NEMS antifuses, and compare their advantageous performance with state-of-the-art conventional antifuse FPGAs. We also demonstrate a SiC NEMS antifuse-based OTP memory cell with a read margin of >106.
Keywords :
field programmable gate arrays; integrated circuit interconnections; low-power electronics; nanoelectromechanical devices; silicon compounds; FPGA benchmarking circuits; NEMS; OTP interconnects; SiC; field-programmable gate arrays; harsh-environment applications; memory cell; nanoelectromechanical antifuse; nanoelectromechanical systems; read margin; security-sensitive applications; ultralow-power one-time-programmable interconnects; Current measurement; Field programmable gate arrays; Logic gates; Nanoelectromechanical systems; Programming; Silicon carbide; Voltage measurement; Antifuse; Field Programmable Gate Array (FPGA); Nanoelectromechanical Systems (NEMS); Programming Voltage; Silicon Carbide (SiC); Ultralow Power; field-programmable gate array (FPGA); nanoelectromechanical systems (NEMS); programming voltage; silicon carbide (SiC); ultralow power;
fLanguage :
English
Journal_Title :
Electron Devices Society, IEEE Journal of the
Publisher :
ieee
ISSN :
2168-6734
Type :
jour
DOI :
10.1109/JEDS.2015.2421301
Filename :
7083695
Link To Document :
بازگشت