Title :
An Image Metric-Based ATR Performance Prediction Testbed
Author :
Ralph, S.K. ; Irvine, John ; Snorrason, M. ; Vanstone, Steve
Author_Institution :
Charles River Analytics, Cambridge, MA
Abstract :
Automatic target detection (ATD) systems process imagery to detect and locate targets in imagery in support of a variety of military missions. Accurate prediction of ATD performance would assist in system design and trade studies, collection management, and mission planning. A need exists for ATD performance prediction based exclusively on information available from the imagery and its associated metadata. We present a predictor based on image measures quantifying the intrinsic ATD difficulty on an image. The modeling effort consists of two phases: a learning phase, where image measures are computed for a set of test images, the ATD performance is measured, and a prediction model is developed; and a second phase to test and validate performance prediction. The learning phase produces a mapping, valid across various ATR algorithms, which is even applicable when no image truth is avail-able (e.g., when evaluating denied area imagery). The testbed has plug-in capability to allow rapid evaluation of new ATR algorithms. The image measures employed in the model include: statistics derived from a constant false alarm rate (CFAR) processor, the power spectrum signature, and others. We present a performance predictor using a trained classifier ATD that was constructed using GENIE, a tool developed at Los Alamos National Laboratory. The paper concludes with a discussion of future research.
Keywords :
image recognition; target tracking; ATR performance prediction testbed; Power Spectrum Signature; automatic target detection; constant false alarm rate processor; Automatic testing; Geometry; Iterative algorithms; Military computing; Phase measurement; Predictive models; Robustness; System testing; Temperature sensors; Wavelength measurement;
Conference_Titel :
Applied Imagery and Pattern Recognition Workshop, 2006. AIPR 2006. 35th IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7695-2739-6
Electronic_ISBN :
1550-5219
DOI :
10.1109/AIPR.2006.13