2n Pattern run-length for test data compression

This paper presents a pattern run-length compression method. Compression is conducted by encoding 2^|n| runs of compatible or inversely compatible patterns into codewords in both views either inside a single segment or across multiple segments. With the provision of high compression flexibility, this method can achieve significant compression. Experimental results for the large ISCAS´89 benchmark circuits have demonstrated that the proposed approach can achieve up to 67.64% of average compression ratio.