Title :
Proceedings International Test Conference 1996. Test and Design Validity
Abstract :
The following topics are dealt with: automatic test generation; BIST architectures and generators; mixed signal devices; test hardware; fault simulation; BIST pattern generation; asynchronous circuits testing; industrial testing; delay faults; design for testability; board test; microprocessor test; mixed signal boundary scan; test software; partial scan design; test languages; ATE; test synthesis; fault modelling; MCM test; hybrid validation; design validation; unpowered opens testing; failure analysis; CAD; asynchronous design; and DFT
Keywords :
automatic test equipment; automatic test software; automatic testing; built-in self test; design for testability; integrated circuit testing; logic design; logic testing; mixed analogue-digital integrated circuits; production testing; ATE; BIST architectures; BIST pattern generation; CAD; DFT; MCM; asynchronous circuits testing; asynchronous design; automatic test generation; board test; delay faults; design for testability; design validation; failure analysis; fault modelling; fault simulation; hybrid validation; industrial testing; microprocessor test; mixed signal boundary scan; mixed signal devices; partial scan design; test hardware; test languages; test software; test synthesis;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.556937
