DocumentCode
2030527
Title
Predicting let-through arc-flash energy for current-limiting circuit breakers
Author
Papallo, Tom ; Valdes, Marcelo ; Roscoe, George
Author_Institution
GE Consumer & Ind., Plainville, CT, USA
fYear
2009
fDate
14-16 Sept. 2009
Firstpage
1
Lastpage
7
Abstract
IEEE 1584, "Guide For Performing Arc Flash Incident Energy Calculations," provides a method to conservatively predict the incident energy let-through by over-current devices based on the device\´s time-current-curve or tested transfer functions. Additional testing by various manufacturers shows that current-limiting circuit breakers operating in their instantaneous current-limiting range perform significantly better than the IEEE Time-Current Curve-based model predicts. The authors will present an analytical method to estimate incident energy from published circuit breaker let-through curves. The method will provide a conservative, yet better estimate of the actual performance compared to test data. This method can be used as part of hazard risk planning rather than the method described in IEEE 1584 or when the manufacturer does not provide an incident-energy transfer function based on tests.
Keywords
IEEE standards; arcs (electric); circuit breakers; fault current limiters; hazards; overcurrent protection; risk analysis; IEEE 1584; circuit breaker let- through curves; current-limiting circuit breakers; hazard risk planning; incident energy; incident-energy transfer function; let-through arc-flash energy; over-current devices; time-current curve-based model; Circuit breakers; Circuit faults; Circuit testing; Equations; Fault currents; IEEE members; Performance evaluation; Thermal force; Voltage; Wood industry; IEEE 1584; arc flash; circuit breaker-let-through curves; current-limiting circuit breaker; hazard risk planning; instantaneous current limiting;
fLanguage
English
Publisher
ieee
Conference_Titel
Petroleum and Chemical Industry Conference, 2009. PCIC 2009. 2009 Record of Conference Papers - Industry Applications Society 56th Annual
Conference_Location
Anaheim, CA
ISSN
0090-3507
Print_ISBN
978-1-4244-3798-6
Electronic_ISBN
0090-3507
Type
conf
DOI
10.1109/PCICON.2009.5297150
Filename
5297150
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