• DocumentCode
    2030680
  • Title

    Nano-degradation of diamond surfaces by the thermochemical polishing technique

  • Author

    Weima, J.A. ; Job, R. ; Fahrner, W.R. ; Muller, N. ; Fries, T.

  • Author_Institution
    Dept. of Electron. Devices, Univ. of Hagen, Germany
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1856
  • Abstract
    The surface roughness of pre-polished polycrystalline diamond films was measured by the stylus profilometer to be 30 μm and 9 μm on the growth and substrate sides respectively. SEM topographic images of the films showed that the size of the crystallites forming the films ranged between 5-40 μm. The crystallites are seen to be oriented randomly in various planes and directions. AFM measurements performed on thermochemically polished diamond films revealed that the arithmetical mean deviation was reduced to 1.3 nm and 1.5 nm on both the growth and substrate sides respectively. Raman spectra of optical grade films polished at temperatures between 950-1050°C contained lines in the low frequency regime between 100-700 cm-1. The intensities of these lines are influenced by laser exposure time prior to measurement. The lines are tentatively attributed to nano-clusters formed by carbon particles which are left on the surfaces of the films during the polishing process. The spectra also entailed nano- and micro-crystalline graphite bands at frequencies of 1351 cm-1 and 1577 cm-1 respectively. These bands are attributed to disordered graphite of nano- and micro-sizes accumulated on the surface of the film as a result of thermochemical polishing
  • Keywords
    CVD coatings; Raman spectra; atomic force microscopy; chemical mechanical polishing; diamond; elemental semiconductors; scanning electron microscopy; surface topography measurement; thermochemistry; 5 to 40 micron; 950 to 1050 C; AFM measurements; CVD; Profilometry; Raman spectra; SEM; carbon particles; diamond surfaces; growth; laser exposure time; nano-clusters; nano-degradation; optical grade films; pre-polished polycrystalline diamond films; stylus profilometer; surface nano-degradation; surface roughness; thermochemical polishing; thermochemistry; topographic images; Crystallization; Frequency; Optical films; Performance evaluation; Rough surfaces; Substrates; Surface roughness; Surface topography; Temperature; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2000. IECON 2000. 26th Annual Confjerence of the IEEE
  • Conference_Location
    Nagoya
  • Print_ISBN
    0-7803-6456-2
  • Type

    conf

  • DOI
    10.1109/IECON.2000.972558
  • Filename
    972558