• DocumentCode
    2030917
  • Title

    A BBN-Based Approach for Fault Localization

  • Author

    Liu, Xuemei ; Gu, Guochang ; Liu, Yongpo ; Wu, Ji ; Jia, Xiaoxia

  • Author_Institution
    Coll. of Comput. Sci. & Technol., Beijing City Univ., Beijing
  • fYear
    2009
  • fDate
    23-24 May 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Fault localization techniques help programmers find out the locations and the causes of the faults and accelerate the debugging process. The relation between the fault and the failure is usually complicated, making it hard to deduce how a fault causes the failure. Analysis of variance is broadly used in many correlative researches. In this paper, a Bayesian belief network (BBN) for fault reasoning was constructed based on the suspicious pattern, whose nodes consist of the suspicious pattern and the callers of the methods that constitute the suspicious pattern. The constructing algorithm of the BBN, the correlative probabilities, and the formula for the conditional probabilities of each arc of the BBN were defined. A reasoning algorithm based on the BBN was proposed, through which the faulty module can be found and the probability for each module containing the fault can be calculated. An evaluation method was proposed. Experiments were executed to evaluation this fault localization technique. The data demonstrated that this technique could achieve an average accuracy of 0.761 and an average recall of 0.737. This fault localization technique is very effective and has high practical value.
  • Keywords
    belief networks; fault tolerant computing; probability; program debugging; Bayesian belief network; conditional probabilities; correlative probabilities; debugging process; fault localization; fault reasoning; suspicious pattern; variance analysis; Acceleration; Analysis of variance; Bayesian methods; Computer science; Debugging; Educational institutions; Probability; Programming profession; Software quality; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems and Applications, 2009. ISA 2009. International Workshop on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-3893-8
  • Electronic_ISBN
    978-1-4244-3894-5
  • Type

    conf

  • DOI
    10.1109/IWISA.2009.5072608
  • Filename
    5072608