Title :
New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels
Author :
Yen, Cheng-Cheng ; Lin, Wan-Yen ; Ker, Ming-Dou ; Yang, Che-Ming ; Chen, Shih-Fan ; Chen, Tung-Yang
Author_Institution :
Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.
Keywords :
CMOS integrated circuits; detector circuits; display devices; electrostatic discharge; transient analysis; CMOS process; ESD-induced disturbance detection; HSPICE simulation; automatic recovery design; display panel protection; firmware index; hardware-firmware system codesign; negative electrical transients; size 0.13 nm; system-level ESD tests; system-level electrostatic discharge transient disturbance; transient detection circuit; CMOS integrated circuits; Earth Observing System; Electrostatic discharge; IEC standards; Microelectronics; System-on-a-chip; Transient analysis; detection circuit; electrostatic discharge (ESD); system-level ESD test;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2011 6th International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-61284-899-0
DOI :
10.1109/DTIS.2011.5941441
