Qualification and reliability of thermoelectric coolers for use in laser modules

Author

Corser, T.A.

Author_Institution

AT&T Bell Lab., Breinigsville, PA, USA

fYear

1991

fDate

11-16 May 1991

Firstpage

150

Lastpage

156

Abstract

Reviews extensive data on both environmental testing and life testing (greater than one-million device hours of biased aging) of thermoelectric coolers (TECs) and discusses the dominant failure modes possible during a typical 20-year lifetime. Results indicate that the proper procurement, packaging, and screening of TECs can provide failure rates much less than the 1300 FITs quoted by Bellcore. The overall reliability of standard 18 couple TECs installed in the Astrotec Laser Module are found to be 359 FITs at 10 years, assuming a 40°C T_HOT and a 20°C ΔT. The random failure rate is 140 FITs at 60% confidence limit based on laboratory aging data alone

Keywords

ageing; cooling; environmental testing; laser accessories; life testing; reliability; semiconductor junction lasers; 20 degC; 40 degC; Astrotec Laser Module; TECs; biased aging; confidence limit; environmental testing; failure modes; laser modules; life testing; packaging; reliability; screening; thermoelectric coolers; Aging; Laboratories; Laser modes; Life testing; Optical coupling; Packaging; Procurement; Qualifications; Thermoelectric devices; Thermoelectricity;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 1991. Proceedings., 41st

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-0012-2

Type

conf

DOI

10.1109/ECTC.1991.163868

Filename

163868