Title :
Qualification and reliability of thermoelectric coolers for use in laser modules
Author_Institution :
AT&T Bell Lab., Breinigsville, PA, USA
Abstract :
Reviews extensive data on both environmental testing and life testing (greater than one-million device hours of biased aging) of thermoelectric coolers (TECs) and discusses the dominant failure modes possible during a typical 20-year lifetime. Results indicate that the proper procurement, packaging, and screening of TECs can provide failure rates much less than the 1300 FITs quoted by Bellcore. The overall reliability of standard 18 couple TECs installed in the Astrotec Laser Module are found to be 359 FITs at 10 years, assuming a 40°C THOT and a 20°C ΔT. The random failure rate is 140 FITs at 60% confidence limit based on laboratory aging data alone
Keywords :
ageing; cooling; environmental testing; laser accessories; life testing; reliability; semiconductor junction lasers; 20 degC; 40 degC; Astrotec Laser Module; TECs; biased aging; confidence limit; environmental testing; failure modes; laser modules; life testing; packaging; reliability; screening; thermoelectric coolers; Aging; Laboratories; Laser modes; Life testing; Optical coupling; Packaging; Procurement; Qualifications; Thermoelectric devices; Thermoelectricity;
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
DOI :
10.1109/ECTC.1991.163868
