• DocumentCode
    2031127
  • Title

    A standard-cell library suite for deep-deep sub-micron CMOS technologies

  • Author

    Bekiaris, Dimitris ; Papanikolaou, Antonis ; Stamelos, Giorgos ; Soudris, Dimitrios ; Economakos, George ; Pekmestzi, Kiamal

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
  • fYear
    2011
  • fDate
    6-8 April 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The continuous scaling of CMOS transistor and interconnect geometries brings to light novel challenges regarding the design of VLSI systems in the nanoscale era. On the other hand, most of the forthcoming deep-deep submicron technologies are not yet mature to be used for fabrication. Hence, the development of standard-cell libraries at the nanometer regime is emerging, in order to estimate the behavior of complex systems in short-term technology nodes. In this paper, we introduce a standard-cell library generator flow for sub-65nm nodes, based on scaling rules presented in the literature. Our goal is to create a set of complete standard cell libraries enabling the design of large digital systems in technologies not yet available for fabrication. The generated libraries are compatible with the state-of-the-art industrial tool flows and they have been evaluated by benchmarks of medium and large complexity.
  • Keywords
    CMOS integrated circuits; MOSFET; VLSI; integrated circuit design; integrated circuit interconnections; CMOS transistor; VLSI system design; deep-deep submicron CMOS technology; digital systems; industrial tool; interconnect geometry; short-term technology nodes; size 65 nm; standard-cell library generator; standard-cell library suite; CMOS integrated circuits; Delay; Hardware design languages; Libraries; Logic gates; Transistors; Characterization; Standard-cell; Sub-micron;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2011 6th International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-61284-899-0
  • Type

    conf

  • DOI
    10.1109/DTIS.2011.5941445
  • Filename
    5941445