Title :
Temperature scaling of nanoscale silicon MOSFETs
Author :
Sverdlov, V. ; Naveh, Y. ; Likharev, K.K.
Author_Institution :
State University of New York
Keywords :
Capacitance; Clocks; Cooling; Energy consumption; Integrated circuit modeling; MOSFETs; Power supplies; Scattering; Silicon; Temperature dependence;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022443
