DocumentCode
2031184
Title
A parallel processing system for measuring 3D surface profile using RF spectrogram
Author
Hyungtae Kim ; SeungTaek Kim ; Kyungchan Jin
Author_Institution
Smart Syst. Res. Group, KITECH, CheonAn, South Korea
fYear
2013
fDate
8-14 Sept. 2013
Firstpage
1060
Lastpage
1062
Abstract
A scanning system was constructed for detecting 3D profile of a whole body using an RF antenna array and a parallel processing unit. The antenna array generated signals whose information indicated reflection from a target object. The signals in the array were produced during rotation and sampled with triggers by a high speed ADC. The sampled data was transferred to a parallel processing unit. Large number of the triggers and the amount of mathematical computation of frequency analysis forms gigabytes of data size. We showed that the parallel processing unit is useful and time-efficient to detect the 3D profile of whole body by millimeter wave imaging.
Keywords
analogue-digital conversion; microwave antenna arrays; millimetre wave imaging; parallel processing; radiofrequency spectrometers; surface topography measurement; 3D surface profile measurement; RF antenna array; RF spectrogram; high speed ADC; millimeter wave imaging; parallel processing system; rotation; scanning system; target object reflection; whole body; Antenna arrays; Arrays; Graphics processing units; Imaging; Millimeter wave measurements; Millimeter wave technology; Three-dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-966-335-395-1
Type
conf
Filename
6652657
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