• DocumentCode
    2031184
  • Title

    A parallel processing system for measuring 3D surface profile using RF spectrogram

  • Author

    Hyungtae Kim ; SeungTaek Kim ; Kyungchan Jin

  • Author_Institution
    Smart Syst. Res. Group, KITECH, CheonAn, South Korea
  • fYear
    2013
  • fDate
    8-14 Sept. 2013
  • Firstpage
    1060
  • Lastpage
    1062
  • Abstract
    A scanning system was constructed for detecting 3D profile of a whole body using an RF antenna array and a parallel processing unit. The antenna array generated signals whose information indicated reflection from a target object. The signals in the array were produced during rotation and sampled with triggers by a high speed ADC. The sampled data was transferred to a parallel processing unit. Large number of the triggers and the amount of mathematical computation of frequency analysis forms gigabytes of data size. We showed that the parallel processing unit is useful and time-efficient to detect the 3D profile of whole body by millimeter wave imaging.
  • Keywords
    analogue-digital conversion; microwave antenna arrays; millimetre wave imaging; parallel processing; radiofrequency spectrometers; surface topography measurement; 3D surface profile measurement; RF antenna array; RF spectrogram; high speed ADC; millimeter wave imaging; parallel processing system; rotation; scanning system; target object reflection; whole body; Antenna arrays; Arrays; Graphics processing units; Imaging; Millimeter wave measurements; Millimeter wave technology; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-966-335-395-1
  • Type

    conf

  • Filename
    6652657