DocumentCode :
2031220
Title :
Application of a wavelet-based signal analysis for evaluating the tool state in cutting operations
Author :
Klocke, F. ; Reuber, M. ; Kratz, H.
Author_Institution :
Inst. of Machine Tools & Production Eng. (WZL), Aachen Univ. of Technol., Germany
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1967
Abstract :
Manufacturing within a flexible production environment rises high demands on a sensor based monitoring of process and tool state. Frequently changing machining conditions in one-off and small batch size production require intelligent and flexible process monitoring systems. Signal analysis and disturbance identification strategies must be able to reliably separate signal pattern caused by the occurrence of tool wear from signal variations in the regular cutting process. Finish milling of sculptured surfaces is characterised by permanently changing engagement conditions between the ball end milling tool and the workpiece surface. The paper describes developments for tool wear monitoring in this complex machining process. The combination of the wavelet based signal parameters and an engagement dependent monitoring strategy allows a reliable determination of the tool state
Keywords :
batch processing (industrial); computerised monitoring; cutting; knowledge based systems; process monitoring; signal processing; wavelet transforms; ball end milling tool; cutting operations; cutting process; disturbance identification; engagement dependent monitoring strategy; finish milling; flexible production environment; intelligent flexible process monitoring systems; machining conditions; manufacturing; one-off production; process state; sculptured surfaces; sensor based monitoring; signal analysis; small batch size production; tool state; tool state evaluation; tool wear monitoring; wavelet based signal parameters; wavelet-based signal analysis; workpiece surface; Condition monitoring; Flexible manufacturing systems; Intelligent sensors; Machining; Manufacturing processes; Milling; Signal analysis; Signal processing; Surface finishing; Wavelet analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2000. IECON 2000. 26th Annual Confjerence of the IEEE
Conference_Location :
Nagoya
Print_ISBN :
0-7803-6456-2
Type :
conf
DOI :
10.1109/IECON.2000.972577
Filename :
972577
Link To Document :
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