DocumentCode

2031232

Title

New silicon devices beyond CMOS

Author

Suzuki, E. ; Ishii, Kazuki ; Sekigawa, T.

Author_Institution

Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology

fYear

2002

fDate

2002

Firstpage

27

Lastpage

30

Keywords

CMOS technology; Circuits; Degradation; MOS devices; MOSFETs; Nanoelectronics; Nanotechnology; Silicon devices; Threshold voltage; Ultra large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on

ISSN

1155-4339

Print_ISBN

2-86883-606-2

Type

conf

DOI

10.1109/WOLTE.2002.1022445

Filename

1022445