Title :
Low frequency noise versus temperature spectroscopy of Go JFETs, Si JFETs and Si MOSFETs
Author :
Camin, Camin D. ; Colombo, Colombo C. ; Grassi, Grassi V.
Author_Institution :
Universita and Istituto Nazionale di Fisica Nucleare
Keywords :
Electron traps; FETs; Instruments; JFETs; Low-frequency noise; MOSFETs; Noise measurement; Performance evaluation; Spectroscopy; Temperature;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022447
