DocumentCode :
2031289
Title :
Cryogenic operation of sub-30 nm nMOSFETs: impact of device architecture
Author :
Bertrand, G. ; Deleonibus, S. ; Souil, D. ; Previtali, B. ; Caillat, C. ; Guegan, G. ; Sanquer, Marc ; Balestra, F.
Author_Institution :
Institut de Microelectronique
fYear :
2002
fDate :
2002
Firstpage :
45
Lastpage :
49
Keywords :
Ballistic transport; Cryogenics; Degradation; Doping; Implants; MOSFETs; Temperature dependence; Temperature distribution; Threshold voltage; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
ISSN :
1155-4339
Print_ISBN :
2-86883-606-2
Type :
conf
DOI :
10.1109/WOLTE.2002.1022448
Filename :
1022448
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2031289
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