• DocumentCode
    2031341
  • Title

    Low temperature operation of ultra-thin gate oxide sub-0.1 μm MOSFETs

  • Author

    Cretu, B. ; Balestra, F. ; Ghibaudo, G. ; Guegan, G.

  • Author_Institution
    CEA-LETI
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    57
  • Lastpage
    60
  • Keywords
    CMOS technology; Circuit optimization; Degradation; Hot carriers; Leakage current; Linear predictive coding; MOSFETs; Temperature distribution; Thermal resistance; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
  • ISSN
    1155-4339
  • Print_ISBN
    2-86883-606-2
  • Type

    conf

  • DOI
    10.1109/WOLTE.2002.1022450
  • Filename
    1022450