DocumentCode :
2031341
Title :
Low temperature operation of ultra-thin gate oxide sub-0.1 μm MOSFETs
Author :
Cretu, B. ; Balestra, F. ; Ghibaudo, G. ; Guegan, G.
Author_Institution :
CEA-LETI
fYear :
2002
fDate :
2002
Firstpage :
57
Lastpage :
60
Keywords :
CMOS technology; Circuit optimization; Degradation; Hot carriers; Leakage current; Linear predictive coding; MOSFETs; Temperature distribution; Thermal resistance; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
ISSN :
1155-4339
Print_ISBN :
2-86883-606-2
Type :
conf
DOI :
10.1109/WOLTE.2002.1022450
Filename :
1022450
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2031341
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