Title :
Temperature dependence of generation-recombination noise in p-n junctions
Author :
Tejada, J. A Jiménez ; Godoy, A. ; Palma, A. ; Cartujo, P.
Author_Institution :
Universidad de Granada
Keywords :
Current measurement; Electron traps; Fluctuations; Frequency; Low-frequency noise; Noise generators; Noise measurement; P-n junctions; Temperature dependence; Voltage;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022453
