Title :
Random telegraph noise in ultimate MOSFETs at very low temperature in the subthreshold regime
Author :
Jehl, X. ; Sanquer, M. ; Bertrand, G. ; Guégan, G. ; Deleonibus, Simon
Author_Institution :
CEA Grenoble
Keywords :
Capacitance; Intrusion detection; MOSFETs; Quantum mechanics; Resonance; Resonant tunneling devices; Spectroscopy; Telegraphy; Temperature sensors; Threshold voltage;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022460
