DocumentCode :
2031975
Title :
Experimental investigation of bulk response of cells on optoelectronic dielectrophoresis chip
Author :
Puttaswamy, Srinivasu Valagerahally ; Yang, Shih-Mo ; Sivashankar, Shilpa ; Chang, Kuo-Wei ; Hsu, Long ; Liu, Cheng-Hsien
Author_Institution :
Microsyst. & Control Lab., Nat. Tsing-Hua Univ., Hsinchu, Taiwan
fYear :
2012
fDate :
5-8 March 2012
Firstpage :
162
Lastpage :
165
Abstract :
The mechanism of the particle interactions is still inconclusive, even though many researchers have tried to figure out the particle-particle interactions under the influence of electric field. In this paper we report an experimental investigation of electrostatic attraction and repulsion of endothelial cells in an image-driven light induced dielectrophoresis (DEP) apparatus. The optoelectronic tweezers (OET) device consists of a planar structure having one or more portions which are photoconductive to convert incoming light to a change in the electric field pattern. When the cells are manipulated in OET chip at a frequency near the threshold of electrolysis, cells exhibits numerous interesting phenomena such as spinning, collision, rotation and pearl chain effect in three-dimensional (3D) space. All of these cell behaviors at such critical frequencies on this OET chip are reported.
Keywords :
bioMEMS; bioelectric phenomena; cellular biophysics; electrolysis; electrophoresis; lab-on-a-chip; optoelectronic devices; photoconductivity; radiation pressure; collision effect; electrostatic attraction; electrostatic repulsion; endothelial cells; image-driven light induced dielectrophoresis chip; optoelectronic dielectrophoresis chip; optoelectronic tweezer device; particle-particle interactions; pearl chain effect; photoconductivity; rotation effect; spinning effect; Computers; Nanoelectromechanical systems; Software; Dielectrophoresis; cell behavior; optoelectronic tweezers; pearl chain effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-1122-9
Type :
conf
DOI :
10.1109/NEMS.2012.6196747
Filename :
6196747
Link To Document :
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