DocumentCode :
2032072
Title :
N3ASICs: Designing nanofabrics with fine-grained CMOS integration
Author :
Panchapakeshan, Pavan ; Narayanan, Pritish ; Moritz, Csaba Andras
Author_Institution :
Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, Amherst, MA, USA
fYear :
2011
fDate :
8-9 June 2011
Firstpage :
196
Lastpage :
202
Abstract :
We propose a novel nanofabric approach that mixes unconventional nanomanufacturing with CMOS manufacturing flow and design rules in order to build a reliable nanowire-CMOS fabric called N3ASIC with no new manufacturing constraints added. Active devices are formed on a dense uniform semiconductor nanowire array and standard area distributed pins/vias; metal interconnects route the signals in 3D. CMOS design rules are followed. Novel nanowire based devices are envisioned and characterized based on 3D physics modeling. Overall N3ASIC fabric design, associated circuits, interconnection approach, and a layer-by-layer assembly sequence for the fabric are introduced. Key system level metrics such as power, performance, and density for a nanoprocessor design built using N3ASICs were evaluated and compared against a functionally equivalent CMOS design synthesized with state-of-the-art CAD tools. We show that the N3ASICs version of the processor is 3X denser and 5X more power efficient for a comparable performance than the 16-nm scaled CMOS version even without any new/unknown-manufacturing requirement added.
Keywords :
CMOS integrated circuits; application specific integrated circuits; integrated circuit design; integrated circuit interconnections; nanofabrication; nanowires; technology CAD (electronics); three-dimensional integrated circuits; 3D physics modeling; CAD tools; CMOS design rules; N3ASIC fabric design; application specific integrated circuits; associated circuits; fine-grained CMOS integration; layer-by-layer assembly sequence; manufacturing constraints; metal interconnects; nanofabrics; nanomanufacturing; nanoprocessor design; nanowire-CMOS fabric; semiconductor nanowire array; size 16 nm; standard area distributed pins-vias; CMOS integrated circuits; Fabrics; Integrated circuit modeling; Logic gates; Metals; Nanoscale devices; Semiconductor device modeling; 3-D integration; N3ASIC; NASIC; nano-CMOS hybrid system; nanowires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoscale Architectures (NANOARCH), 2011 IEEE/ACM International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0993-7
Type :
conf
DOI :
10.1109/NANOARCH.2011.5941504
Filename :
5941504
Link To Document :
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