Title :
Center Gate Molding challenges and improvements for cavity down TBGA packages
Author :
Muniandy, K. ; Hian, Serene Teh Seoh ; Teng Seng Kiong
Author_Institution :
Freescale Semicond. Malaysia Sdn. Bhd., Petaling Jaya, Malaysia
Abstract :
Center Gate Molding or also known as Pin Gate Molding is a molding method that is gaining a lot of interest in the market in recent times. This is due to its improvement in wire sweep performance for ultra fine pitch wire bonding and ability to capitalize desirable mold compound mechanical properties. The main reason for this is the mold flow of the compound is radial with the wire which will minimize flow stress on bonded wire rather than opposing the wire in the typical side gate molding. This paper discusses the key challenges and the improvements that have been implemented for the center gate molding for the cavity down TBGA (Tape Ball Grid Array) package in the High Volume Manufacturing (HVM). Substrate type which includes the different stack up of the polyimide tape was one of the major concerns for implementing molding on the cavity down TBGA package. The various substrate stack up of the polyimide tape were evaluated and Design of Experiments (DOE) were applied to determine the optimum molding process conditions in order to achieve a material set for overall process robustness.
Keywords :
ball grid arrays; fine-pitch technology; lead bonding; mechanical properties; moulding; DOE; HVM; TBGA package; cavity improvement; center gate molding challenge; design of experiments; flow stress; high volume manufacturing; mold compound mechanical properties; mold flow; optimum molding process conditions; pin gate molding; tape ball grid array package; typical side gate molding; ultra fine pitch wire bonding; wire bonding; Absorption; Conferences; Decision support systems; Electronics packaging;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4553-8
Electronic_ISBN :
978-1-4673-4551-4
DOI :
10.1109/EPTC.2012.6507040