DocumentCode
2032346
Title
Electrical material property measurements using a free-field, ultra-wideband system [dielectric measurements]
Author
Grosvenor, C.A. ; Johnk, R. ; Novotny, D. ; Canales, S. ; Baker-Jarvis, J. ; Janezic, M. ; Drewniak, J. ; Koledintseva, M. ; Zhang, J. ; Rawa, P.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear
2004
fDate
17-20 Oct. 2004
Firstpage
174
Lastpage
177
Abstract
We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.
Keywords
dielectric measurement; genetic algorithms; horn antennas; microwave measurement; network analysers; 300 kHz to 4000 MHz; TEM horn antennas; dielectric properties measurements; electrical material property measurements; free-field ultra-wideband system; genetic algorithms; nondestructive measurement; short-impulse-response antennas; time-domain gating; vector network analyzer; Antenna measurements; Data mining; Dielectric measurements; Electric variables measurement; Genetic algorithms; Horn antennas; Material properties; Time domain analysis; Ultra wideband antennas; Ultra wideband technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN
0-7803-8584-5
Type
conf
DOI
10.1109/CEIDP.2004.1364217
Filename
1364217
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