Title :
Electrical material property measurements using a free-field, ultra-wideband system [dielectric measurements]
Author :
Grosvenor, C.A. ; Johnk, R. ; Novotny, D. ; Canales, S. ; Baker-Jarvis, J. ; Janezic, M. ; Drewniak, J. ; Koledintseva, M. ; Zhang, J. ; Rawa, P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.
Keywords :
dielectric measurement; genetic algorithms; horn antennas; microwave measurement; network analysers; 300 kHz to 4000 MHz; TEM horn antennas; dielectric properties measurements; electrical material property measurements; free-field ultra-wideband system; genetic algorithms; nondestructive measurement; short-impulse-response antennas; time-domain gating; vector network analyzer; Antenna measurements; Data mining; Dielectric measurements; Electric variables measurement; Genetic algorithms; Horn antennas; Material properties; Time domain analysis; Ultra wideband antennas; Ultra wideband technology;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN :
0-7803-8584-5
DOI :
10.1109/CEIDP.2004.1364217
