• DocumentCode
    2032554
  • Title

    Application of Back-side Alignment of Thick Layers for the Manufacturing of Advanced Power Devices

  • Author

    Lee, Jung Kil ; Chisholm, Rodney ; Van der Heijden, Mark ; Best, Keith ; Ten Berge, Peter

  • Author_Institution
    Fairchild Semicond. Korea, Gyeonggi
  • fYear
    2006
  • fDate
    22-24 May 2006
  • Firstpage
    104
  • Lastpage
    107
  • Abstract
    Back-side alignment was implemented in the thick layer process flow for the production of advanced power devices. The alignment and overlay performance of the back-side alignment scheme are addressed, as well as the benefits in terms of productivity and cost reduction
  • Keywords
    power semiconductor devices; semiconductor device manufacture; advanced power device manufacturing; back side alignment; cost reduction; overlay performance; productivity terms; Costs; Degradation; Manufacturing processes; Optical films; Production; Productivity; Semiconductor device manufacture; Silicon; Thick films; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    1-4244-0254-9
  • Type

    conf

  • DOI
    10.1109/ASMC.2006.1638732
  • Filename
    1638732