Title :
Aging behaviour of cross-linked polyethylene (XLPE) as an insulating material for high (HV)- and extra-high voltage cables (EHV)
Author :
Muhr, M. ; Neges, E. ; Woschitz, R. ; Sumereder, Ch
Author_Institution :
Inst. of High Voltage Eng. & Syst. Manage., Graz Univ. of Technol., Austria
Abstract :
The objective of this paper is the scientific investigation of the electrical long-time response of XLPE-insulation. The electrical XLPE-insulation system is susceptible to aging when subjected to the thermal, electrical, environmental and mechanical stresses experienced under service conditions. Based on extensive experimental research work concerning the breakdown behaviour of XLPE, it is shown in this paper that beyond the statistical history, space charge processes contribute to the AC dielectric strength decrease of thick-walled XLPE-insulation. Values for the AC breakdown strength from long time tests on a cable model and 2 real cables are given and an example for calculation with approximation methods, to compare the values, is carried out. Weibull statistical analysis of area and volume effects on the breakdown strength in XLPE, for a coaxial cylindrical electrode configuration, is examined.
Keywords :
Weibull distribution; XLPE insulation; electric breakdown; electric strength; life testing; power cable insulation; space charge; strain ageing; AC dielectric strength decrease; EHV; Weibull statistical analysis; XLPE aging behaviour; XLPE breakdown; approximation methods; area effects; coaxial cylindrical electrode configuration; cross-linked polyethylene insulating material; electrical long-time response; extra-high voltage cables; extruded transmission cables; high voltage cables; service condition stresses; space charge processes; thick-walled XLPE-insulation; volume effects; Aging; Cable insulation; Cables; Dielectric breakdown; Electric breakdown; History; Polyethylene; Space charge; Thermal stresses; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN :
0-7803-8584-5
DOI :
10.1109/CEIDP.2004.1364231