Title :
Fluctuation Smoothing Production Control at IBM´s 200mm Wafer Fabricator: Extensions, Application and the Multi-Flow Production Index (MFPx)
Author :
Morrison, James R. ; Dews, Elizabeth ; LaFreniere, John
Author_Institution :
Dept. of Eng. & Technol., Central Michigan Univ., Mount Pleasant, MI
Abstract :
To increase the flexibility of existing production control algorithms and reduce the variation and mean of fabricator cycle times, a fluctuation smoothing for the variation of cycle time (FSVCT) policy was implemented at IBM´s 200mm semiconductor wafer fabrication facility. Extensions allowing for products with different cycle times and enabling the change of cycle time targets during production were developed. The policy was named the multi-flow production index (MFPx), reflective of its capabilities. Increased production agility and a controlled variation of cycle time resulted from the implementation
Keywords :
production control; production facilities; 200 mm; cycle times; fluctuation smoothing; multiflow production index; production control algorithms; semiconductor wafer fabrication facility; Analytical models; Costs; Customer satisfaction; Fabrication; Fluctuations; Lead time reduction; Production control; Semiconductor device manufacture; Smoothing methods; Time to market;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
Conference_Location :
Boston, MA
Print_ISBN :
1-4244-0254-9
DOI :
10.1109/ASMC.2006.1638737
