• DocumentCode
    2032718
  • Title

    Achieving Reduced Production Cycle Times Via Effective Control of Key Factors of the P-K Equation

  • Author

    Kalir, Adar ; Bouhnik, Sylvain

  • Author_Institution
    Intel Electron. Ltd., Qiryat Gat
  • fYear
    2006
  • fDate
    22-24 May 2006
  • Firstpage
    139
  • Lastpage
    143
  • Abstract
    In the current environment of flash semiconductor market, competitive cycle times are the key to success. Cycle time (CT) reduction can be achieved by process time elimination and equipment performance improvement, but also by optimized WIP management policy. In this paper, we discuss how significant CT reductions are attained via the effective change of parameter values of the governing WIP management policy of a semiconductor factory. A full factorial design of experiments (DOE) was performed, and several parameters were examined. The impact on the coefficient of variability of departure rate (CDR) and CT was evaluated. Results have clearly shown that by changing the values of these parameters, significant cycle time reductions of up to 13% can be achieved
  • Keywords
    design of experiments; lead time reduction; semiconductor device manufacture; work in progress; P-K equation; WIP management policy; cycle time reduction; design of experiments; equipment performance improvement; flash semiconductor market; process time elimination; production cycle times; semiconductor factory; Application specific processors; Availability; Consumer electronics; Equations; Production facilities; US Department of Energy; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    1-4244-0254-9
  • Type

    conf

  • DOI
    10.1109/ASMC.2006.1638738
  • Filename
    1638738