DocumentCode :
2032718
Title :
Achieving Reduced Production Cycle Times Via Effective Control of Key Factors of the P-K Equation
Author :
Kalir, Adar ; Bouhnik, Sylvain
Author_Institution :
Intel Electron. Ltd., Qiryat Gat
fYear :
2006
fDate :
22-24 May 2006
Firstpage :
139
Lastpage :
143
Abstract :
In the current environment of flash semiconductor market, competitive cycle times are the key to success. Cycle time (CT) reduction can be achieved by process time elimination and equipment performance improvement, but also by optimized WIP management policy. In this paper, we discuss how significant CT reductions are attained via the effective change of parameter values of the governing WIP management policy of a semiconductor factory. A full factorial design of experiments (DOE) was performed, and several parameters were examined. The impact on the coefficient of variability of departure rate (CDR) and CT was evaluated. Results have clearly shown that by changing the values of these parameters, significant cycle time reductions of up to 13% can be achieved
Keywords :
design of experiments; lead time reduction; semiconductor device manufacture; work in progress; P-K equation; WIP management policy; cycle time reduction; design of experiments; equipment performance improvement; flash semiconductor market; process time elimination; production cycle times; semiconductor factory; Application specific processors; Availability; Consumer electronics; Equations; Production facilities; US Department of Energy; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
Conference_Location :
Boston, MA
ISSN :
1078-8743
Print_ISBN :
1-4244-0254-9
Type :
conf
DOI :
10.1109/ASMC.2006.1638738
Filename :
1638738
Link To Document :
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