Title :
Ligand-exchange of TOPO-capped CdSe quantum dots with quinuclidines
Author :
Obliosca, Judy M. ; Tseng, Fan-Gang ; Huang, Ching-Mao ; Lo, Leu-Wei ; Wang, Pen-Cheng
Author_Institution :
Dept. of Eng. & Syst. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
A series of tertiary amine quinuclidine-capped cadmium selenide (Q-CdSe) quantum dots (QDs) of ~4 nm in diameter was successfully synthesized via ligand exchange process in which the original hydrophobic trioctylphosphine oxide (TOPO) ligand bound to QDs was replaced with stronger quinuclidine derivatives, quinuclidine (Q1), 3-quinuclidinone (Q2) and 3-quinuclidinol (Q3). The ligand exchange of TOPO by Q probed using the combined fluorescence and absorption spectroscopy was achieved in just only a few minutes. Moreover, disappearance of prominent C-H aliphatic stretching (~2900 cm-1) and phosphate signal (35 ppm) of TOPO-capped CdSe after replacement with Q as revealed in FT-IR and solid state 31P-NMR spectra was observed indicating efficient fast ligand exchange.
Keywords :
Fourier transform spectra; II-VI semiconductors; cadmium compounds; chemical exchanges; fluorescence; fluorescence spectroscopy; hydrophobicity; infrared spectra; materials preparation; organic compounds; proton magnetic resonance; semiconductor quantum dots; ultraviolet spectra; visible spectra; wide band gap semiconductors; 3-quinuclidinol; 3-quinuclidinone; 1H NMR spectra; CdSe; FTIR spectroscopy; Fourier transform infrared spectrsocopy; UV-visible absorption spectroscopy; fluorescence spectroscopy; hydrophobic trioctylphosphine oxide ligand; ligand exchange; nuclear magnetic resonance spectra; quinuclidine derivatives; solid-state 31P NMR spectra; tertiary amine quinuclidine-capped cadmium selenide quantum dots; Electronic mail; Heating; Microscopy; Multiplexing; Nanoelectromechanical systems; Nuclear magnetic resonance; Spectroscopy; 31PNMR spectroscopy; CdSe quantum dots; ligand-exchange; quinuclidines; tertiary amines;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-1122-9
DOI :
10.1109/NEMS.2012.6196789