Title :
Robust adaptive control of a 3-axis motion simulator for instruments testing
Author :
Yue, Xie ; Vilathgamuwa, D. Mahinda ; Tseng, K.J. ; Nagarajan, N.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
In this paper, a 3-axis motion simulator is proposed to provide a laboratory environment for testing spacecraft instruments. A mathematical model of the simulator mechanical structure is developed by means of calculating angular momentum of each rotating part with respect to relevant reference frames. Motion simulator actuators are permanent magnet synchronous motor (PMSM) drives. A compact mathematical model of the whole electromechanical system is obtained by representing the PMSM drives in their field orientation. By using Lyapunov stability theory and linearization techniques, a novel robust adaptive nonlinear control law, which is not only adaptable to constant unknown parameters but also robust to unknown but bounded fast varying disturbances, is developed for the tracking task of this PMSM direct driven system. The efficiency and correctness of the proposed control system are verified by simulation and experimental results.
Keywords :
Lyapunov methods; adaptive control; aerospace instrumentation; aerospace testing; machine control; permanent magnet motors; robust control; space vehicles; synchronous motor drives; 3-axis motion simulator; Lyapunov stability theory; PMSM drives; angular momentum; bounded fast varying disturbances; constant unknown parameters; linearization techniques; mathematical model; mechanical structure; motion simulator actuators; permanent magnet synchronous motor drives; robust adaptive control; robust adaptive nonlinear control law; rotating part; spacecraft instruments testing; Actuators; Adaptive control; Electromechanical systems; Instruments; Mathematical model; Permanent magnet motors; Robust control; Robust stability; Space vehicles; Testing;
Conference_Titel :
Power Electronics Specialists Conference, 2002. pesc 02. 2002 IEEE 33rd Annual
Print_ISBN :
0-7803-7262-X
DOI :
10.1109/PSEC.2002.1022511