DocumentCode :
2033142
Title :
Microscopic and nanoscopic EVA composite investigation: Electrical properties and effect of purification treatment
Author :
Montanari, Gian ; Cavallini, A. ; Guastavino, F. ; Coletti, G. ; Schifani, R. ; Del Casale, M. Di Lorenzo ; Camin, G. ; Deorsola, F.
Author_Institution :
DIE-LIMAT, Bologna Univ., Italy
fYear :
2004
fDate :
17-20 Oct. 2004
Firstpage :
318
Lastpage :
321
Abstract :
This work presents preliminary results of an investigation aiming at characterization of nanocomposite insulating materials. Focus is made on size and technological process effects, i.e. dependence of electrical properties on filler size, on polymer-nanofiller interaction (e.g. intercalation or exfoliation) and, in particular, on chemical purification procedures. The materials under investigation are (EVA) copolymer filled by layered micro and nanosized silicates consisting of montmorillonite and fluorohectorite, that is, natural and synthetic clays. Microstructural characterization, using transmission electron microscopy, TEM, and wide-angle X-ray spectroscopy, WAXS, and electrical measurement results, particularly space charge, are presented and discussed, showing that nanostructuration of EVA-synthetic clay, especially in the exfoliated morphology, can give rise to interesting modification of electrical properties, only if, however, chemical purification of nanofillers is carried out effectively.
Keywords :
X-ray spectra; clay; dielectric thin films; filled polymers; insulating thin films; insulation testing; intercalation compounds; nanocomposites; nanoparticles; particle reinforced composites; space charge; transmission electron microscopy; EVA filled copolymer; TEM; WAXS; chemical purification procedures; electrical measurement; electrical properties; exfoliated morphology; exfoliation; filler size; fluorohectorite; intercalation; layered microsized silicates; layered nanosized silicates; microscopic EVA composite; microstructural characterization; montmorillonite; nanocomposite insulating materials; nanofillers; nanoscopic EVA composite; nanostructuration; natural clays; polymer-nanofiller interaction; purification treatment effect; size effects; space charge measurement; synthetic clays; technological process effects; transmission electron microscopy; wide-angle X-ray spectroscopy; Charge measurement; Chemical processes; Chemical technology; Current measurement; Insulation; Nanostructured materials; Polymers; Purification; Spectroscopy; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN :
0-7803-8584-5
Type :
conf
DOI :
10.1109/CEIDP.2004.1364252
Filename :
1364252
Link To Document :
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