DocumentCode :
2033162
Title :
Research the extension method of intelligence fault diagnosis
Author :
Jianjun Qin ; Qiang Li
Author_Institution :
Northern Jiaotong University
fYear :
2002
fDate :
19-19 June 2002
Firstpage :
218
Lastpage :
218
Keywords :
Application software; Circuit faults; Electrical fault detection; Fault detection; Fault diagnosis; Feature extraction; Monitoring; Protection; Short circuit currents; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Automation, 2002. ICCA. Final Program and Book of Abstracts. The 2002 International Conference on
Conference_Location :
Xiamen, Fujian Province, China
Print_ISBN :
0-7803-7412-6
Type :
conf
DOI :
10.1109/ICCA.2002.1229728
Filename :
1229728
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2033162
بازگشت