• DocumentCode
    2033185
  • Title

    Nanophase semi-conductive ceramics: dielectric surface performance when exposed to charges

  • Author

    Fréchette, M.F. ; Larocque, R.Y. ; Blouin, Marco ; Boily, Sabin

  • Author_Institution
    Inst. de recherche d´´Hydro-Quebec, Que., Canada
  • fYear
    2004
  • fDate
    17-20 Oct. 2004
  • Firstpage
    326
  • Lastpage
    331
  • Abstract
    A nanophase composite that is a mix of a ceramic part and a metallic part was prepared by compacting agglomerated nanocrystals of each constituent, the ceramic and the metal. Considering the low Cu content, the resulting cermet was only mildly conductive at room temperature. An experiment was conceived to differentiate the dielectric performance of the nanophase semi-conductive ceramic from its counterpart, for which more extensive sintering had produced crystalline growth. It was found that the dielectric properties of the cermet differed based on the processing conditions. The solid-state sintered cermet still exhibited a microstructure with nanometric grains that was determinant in limiting the bulk and surface conductivity. In turn, the liquid-sintered cermet with its microstructure showing large grains was found to be a more conductive material. This difference in properties was illustrated by imaging charge accumulation and static breakdown at an interface cermet/epoxy.
  • Keywords
    cermets; copper; electrical conductivity; nanocomposites; particle reinforced composites; sintering; surface conductivity; Cu; Cu content; bulk conductivity; ceramic part; cermet/epoxy interface; charge exposure; compacted agglomerated nanocrystals; crystalline growth; dielectric surface performance; imaging charge accumulation; liquid-sintered cermet microstructure; metallic part; nanometric grains; nanophase composite; nanophase semi-conductive ceramics; sintering processing conditions; solid-state sintered cermet microstructure; static breakdown; surface conductivity; Ceramics; Conducting materials; Conductivity; Crystal microstructure; Crystallization; Dielectric materials; Electric breakdown; Nanocrystals; Solid state circuits; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
  • Print_ISBN
    0-7803-8584-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2004.1364254
  • Filename
    1364254