Title :
A demonstration IC for the P1149.4 mixed signal test standard
Author_Institution :
KLIC, Beaverton, OR
Abstract :
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented
Keywords :
CMOS integrated circuits; automatic testing; boundary scan testing; integrated circuit testing; measurement standards; mixed analogue-digital integrated circuits; CMOS IC; P1149.4 mixed signal test standard; characterization data; demonstration IC; mixed-signal boundary scan standard; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Measurement standards; Pins; Software testing; Switches; Switching circuits; System testing; Voltage;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.556949
