DocumentCode :
2033433
Title :
Electrical performance of micro-assembled beads under different temperatures and loadings
Author :
Tzeng, Yen Lin ; Wang, Kerwin
Author_Institution :
Dept. of Mechatron. Eng., Nat. Changhua Univ. of Educ., Changhua, Taiwan
fYear :
2012
fDate :
5-8 March 2012
Firstpage :
433
Lastpage :
436
Abstract :
Micro-assembly is an efficient tool to build electrical connections with metallic micro-beads. This process uses patterned photoresist AZ1512 as an adhesion for micro-bead arrangement. The assembled beads is immobilized with underfill embedment (ZYMET 2821). This method allows arbitrary geometric pattern designs. All of these processes can be completed below 150°C. This paper characterizes the electrical performance of these densely-arranged anisotropic conductive tunnels under different temperatures and stresses loading Experiment results suggest that using photoresist to assemble micro conductive beads with underfill immobilization can yield stable performance.
Keywords :
adhesion; microassembling; photoresists; ZYMET 2821; adhesion; densely-arranged anisotropic conductive tunnels; electrical connections; electrical performance; geometric pattern designs; metallic microbeads; microassembled beads; microassembly; microbead arrangement; patterned photoresist AZ1512; underfill embedment; Computers; Gold; Nickel; Power capacitors; Stress; assembly; micro beads; micro-assembly; underfill; vertical conductive channel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-1122-9
Type :
conf
DOI :
10.1109/NEMS.2012.6196811
Filename :
6196811
Link To Document :
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