Title :
Dielectric relaxation of a composite with tungsten nano-layered spherical filler particles
Author :
Bowler, N. ; Youngs, I.J. ; Lymer, K.P. ; Hussain, S.
Author_Institution :
Center for Nondestructive Evaluation, Iowa State Univ., Ames, IA, USA
Abstract :
The thickness and conductivity of a surface coating on filler particles in a composite material are critical parameters in controlling the frequency at which dielectric relaxation occurs. In this paper, experimental results are presented for composites formed from tungsten-coated glass microbubbles, embedded in a matrix of paraffin wax. The tungsten coating is of the order of 10 nm thick. There is an outer coating of alumina, a few nm thick, to prevent oxidation of the tungsten and to prevent the formation of conducting pathways in the composite. Dielectric relaxation is observed at around 10 GHz. A remarkable feature of the system is the way in which the relaxation frequency is shifted, by approximately six decades, from the calculated value for a similar composite formed with solid tungsten filler particles (≈1016 Hz). This shift is attributed to the geometrical confinement of the conductor within a thin shell, and to the reduction in conductivity of the thin tungsten layer when compared with the conductivity of bulk tungsten.
Keywords :
alumina; composite materials; corrosion protective coatings; dielectric polarisation; dielectric relaxation; glass; microwave materials; nanostructured materials; permittivity; tungsten; waxes; 10 GHz; 10 nm; 10E16 Hz; 15 micron; Maxwell-Wagner-Sillars relaxation; W-Al2O3; antioxidation tungsten coating; composite material filler particles; conduction electrons interfacial polarization; conductor thin shell geometrical confinement; dielectric relaxation frequency; filler particle surface coating thickness; microwave frequency permittivity; paraffin wax matrix; tungsten nanolayered spherical filler particles; tungsten-coated glass microbubbles; Coatings; Composite materials; Conductivity; Dielectrics; Frequency; Glass; Nanocomposites; Oxidation; Thickness control; Tungsten;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN :
0-7803-8584-5
DOI :
10.1109/CEIDP.2004.1364267