• DocumentCode
    2033564
  • Title

    Difference in surface degradation due to partial discharges between polyamide nanocomposite and microcomposite [electrical insulation applications]

  • Author

    Kozako, Masahiro ; Kido, R. ; Fuse, Norikazu ; Ohki, Yoshimichi ; Okamoto, Tatsuki ; Tanaka, Toshikatsu

  • Author_Institution
    Waseda Univ., Kitakyushu, Japan
  • fYear
    2004
  • fDate
    17-20 Oct. 2004
  • Firstpage
    398
  • Lastpage
    401
  • Abstract
    Partial discharge (PD) degradation was investigated to compare polyamide nanocomposites with two kinds of polyamide microcomposites. Such materials were exposed to PDs under the IEC(b) electrode configuration for evaluation of PD resistance. Comparisons were made as to the surface roughness using a scanning electron microscope, an atomic force microscope, and a mechanical surface profilometer. It is concluded that the polyamide nanocomposite is more resistant to PDs than microcomposites, and that nano-effects would work against PD degradation. The nano-effects include filler-matrix bonding, inter-filler space, morphology, and mesoscopic interaction.
  • Keywords
    atomic force microscopy; composite insulating materials; filled polymers; mesoscopic systems; nanocomposites; partial discharges; plastics; scanning electron microscopy; surface roughness; surface topography measurement; atomic force microscopy; electrical insulation; filler-matrix bonding; interfiller space; mechanical surface profilometry; mesoscopic interaction; morphology; nanoeffects; partial discharge resistance; polyamide microcomposite; polyamide nanocomposite; polymer nanocomposites; scanning electron microscopy; surface degradation; surface roughness; Atomic force microscopy; Degradation; Dielectrics and electrical insulation; Partial discharges; Rough surfaces; Scanning electron microscopy; Surface discharges; Surface morphology; Surface resistance; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
  • Print_ISBN
    0-7803-8584-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2004.1364271
  • Filename
    1364271