• DocumentCode
    2033668
  • Title

    Characterization of thermally conductive underfill materials for high performance flip-chip applications

  • Author

    Chew, Marko ; Mian Zhi Ding ; Wai, E. ; Ser Choong Chong ; Rao, V. Srinivasa ; Rhee, Min Woo Daniel

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2012
  • fDate
    5-7 Dec. 2012
  • Firstpage
    283
  • Lastpage
    290
  • Abstract
    In this paper, characterization of 3 types of underfill for high performance applications has been presented. Characterizations of underfill materials such as adhesion testing, contact angle measurement on different surfaces, filler size distribution were conducted to understand the underfill materials. The adhesion test results revealed that failure is mainly mixed mode, which is the failure between bulk underfill failure and interfacial failure. The thermal conductive underfill has a wider range of filler sizes and has the most hydrophilic behavior. From the glass chip flow test, the flow behavior of the underfill could be observed, with the most thermal conductive underfill having the slowest flow. Process optimization for thermal chip and daisy chain chip for void free underfill was also carried out based on dispensing temperature and patterns.
  • Keywords
    adhesion; conducting materials; failure analysis; flip-chip devices; materials testing; thermal conductivity; adhesion test; bulk underfill failure; glass chip flow test; high performance flip-chip applications; hydrophilic behavior; interfacial failure; mixed mode; therm conductive underfill material characterization; thermal chip optimization process; Adhesives; Flip-chip devices; Silicon; Substrates; TV; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4553-8
  • Electronic_ISBN
    978-1-4673-4551-4
  • Type

    conf

  • DOI
    10.1109/EPTC.2012.6507093
  • Filename
    6507093