• DocumentCode
    2033710
  • Title

    Implementation of a subwavelength Bragg reflector for Terahertz applications

  • Author

    Singal, Vikas ; Smaili, Sami ; Massoud, Yehia

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Alabama at Birmingham, Birmingham, AL, USA
  • fYear
    2012
  • fDate
    5-8 March 2012
  • Firstpage
    491
  • Lastpage
    495
  • Abstract
    In recent years, the usage of the Terahertz (THz) portion of the electromagnetic spectrum has been investigated in the field of communications, medicine and biology. The evaluation of the THz wave performance in the applications requires supportive THz based devices such as emitter, detectors and filters. The efficient integration of the THz devices with the state of the art silicon based devices is limited by its typical diffraction limit (millimeters). In this abstract, a subwavelength Surface Plasmon Polaritons (SPPs) based Bragg reflector is using Indium antimonide (InSb), Silicon-dioxide (SiO2) and Porous-SiO2, is proposed. The SPPs based wave propagation at THz allows the nanoscale realization of the THz based devices. The proposed plasmonic Bragg reflector utilizes the periodic changes of the dielectric material in the core layer, while InSb is used in the cladding layer. Finite Element Method (FEM) based simulations are used to demonstrate the working of the proposed subwavelength Bragg reflector.
  • Keywords
    Bragg gratings; finite element analysis; indium compounds; porous semiconductors; silicon compounds; terahertz wave devices; InSb; SiO2; Terahertz applications; art silicon based devices; cladding layer; dielectric material; diffraction limit; electromagnetic spectrum; finite element method; nanoscale realization; subwavelength Bragg reflector; subwavelength surface plasmon polaritons; wave propagation; Biology; Conductors; Detectors; Finite element methods; Spline; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-1122-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2012.6196824
  • Filename
    6196824