• DocumentCode
    2034501
  • Title

    Effect of antioxidants, on deterioration by partial discharge in LDPE and XLPE [insulation materials]

  • Author

    Sekii, Yasuo ; Ohno, Masatoshi ; Oguma, Hidenori

  • Author_Institution
    Chiba Inst. of Technol., Japan
  • fYear
    2004
  • fDate
    17-20 Oct. 2004
  • Firstpage
    547
  • Lastpage
    550
  • Abstract
    The effect of antioxidants in low-density polyethylene (LDPE) and cross-linked polyethylene (XLPE) on deterioration by partial discharge (PD) was investigated. Experiments were conducted using LDPE and XLPE samples containing phenolic antioxidants. Samples subjected to the PD were analyzed using atomic force microscopy and Fourier transform infrared analysis (AFM and FTIR). AFM images demonstrated that the magnitude of pits created in the sample containing antioxidants was smaller than that in samples containing no antioxidant. FTIR showed that oxidative degradation occurred on LDPE and XLPE surfaces when they were subjected to PD. These results confirmed that the amount of oxidized substances was smaller in samples containing phenolic antioxidants than in those containing no antioxidant. This report elucidates the mechanism of antioxidant action on deterioration by PD.
  • Keywords
    Fourier transform spectroscopy; atomic force microscopy; oxidation; partial discharges; polyethylene insulation; AFM; FTIR; Fourier transform infrared analysis; LDPE; PD created pits; XLPE; atomic force microscopy; cross-linked polyethylene; low-density polyethylene; oxidative surface degradation; partial discharge induced deterioration; phenolic antioxidants; polymeric insulating materials; Atomic force microscopy; Degradation; Electrodes; Fourier transforms; Nitrogen; Partial discharges; Plastic insulation; Polyethylene; Polymers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
  • Print_ISBN
    0-7803-8584-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2004.1364308
  • Filename
    1364308