DocumentCode :
2034505
Title :
Switching characteristic model and biochemical application analysis for electrolyte-oxide-semiconductor structure diodes
Author :
Sun, G.C. ; Ma, X.Y. ; Tang, A.S. ; Chen, Y.F. ; Wu, W.G.
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Micro/Nano Fabrication, Peking Univ., Beijing, China
fYear :
2012
fDate :
5-8 March 2012
Firstpage :
644
Lastpage :
648
Abstract :
We present a model and applications analysis of the switching characteristic of electrolyte-oxide-semiconductor (EOS) structure diodes. The EOS structure consists of a heavily-doped silicon layer, an SiO2 layer, and an electrolyte-solution layer, and exhibits diode characteristics when a sweeping voltage is applied. A conduction model of the switching characteristic of EOS diodes is suggested, and implements aspects of ion diffusion theory. The application potential of the EOS structure is also analyzed in accordance with the suggested model. EOS structures provide a simple means to fabricate half-fluidic diodes without photolithography and other sophisticated structure-fabrication processes; hence, they can be utilized for many biochemical applications, such as ion detection and current control in microfluidic devices.
Keywords :
electrolytic devices; semiconductor diodes; biochemical application analysis; conduction model; electrolyte-oxide-semiconductor structure diodes; electrolyte-solution layer; fabricate half-fluidic diodes; heavily-doped silicon layer; ion detection; ion diffusion theory; microfluidic device; photolithography; sophisticated structure-fabrication process; sweeping voltage; switching characteristic model; Analytical models; Artificial intelligence; Biological system modeling; Earth Observing System; Silicon; Switches; electrolyte-oxide-semiconductor structure; ion detection; switching characteristic model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-1122-9
Type :
conf
DOI :
10.1109/NEMS.2012.6196858
Filename :
6196858
Link To Document :
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