DocumentCode
2034601
Title
Capturing interface toughness parameters from shear testing using different fracture mechanics approaches
Author
Auersperg, J. ; Dudek, Rainer ; Bramer, B. ; Pufall, R. ; Seiler, Bettina ; Michel, Bruno
Author_Institution
Micro Mater. Center, Fraunhofer ENAS, Chemnitz, Germany
fYear
2012
fDate
5-7 Dec. 2012
Firstpage
467
Lastpage
473
Abstract
Simple adhesion tests like the pull-out test or the button shear tests have been used in industry for decades. They offer a great potential for comparison of different molding compounds, encapsulants, or adhesives on different types of substrates with or without surface treatment. However, for theoretical prediction purposes, interface fracture mechanics parameters are needed. Quantitative evaluations of the test applied to molding compound (MC)-button on Cu-leadframe by different fracture- and damage mechanical approaches are the subjects of the paper. Defect tolerant methodologies like the "virtual crack closure technique" (VCCT) and the J-inter-action integral approach, which consider the interface initially delaminated, are compared to the damage methodology “cohesive zone modelling (CZM)”, which needs no initial crack and can track the delamination progress. Calculated fracture parameters, in particular the energy release rates and mode mixity are compared. Effects on these parameters are discussed for different button shapes. In-situ tracking of dela-mination progress for a cubic button is shown using the optical correlation technique microDAC.
Keywords
copper; cracks; delamination; electronics packaging; fracture mechanics; moulding; testing; CZM; Cu; J-interaction integral; VCCT; adhesion tests; cohesive zone modelling; damage methodology; defect tolerant methodology; delamination progress; fracture mechanics; in-situ tracking; interface toughness parameter; microDAC; molding compound button; optical correlation technique; quantitative evaluations; shear testing; virtual crack closure technique; Delamination; Finite element analysis; Loading; Shape; Stress; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location
Singapore
Print_ISBN
978-1-4673-4553-8
Electronic_ISBN
978-1-4673-4551-4
Type
conf
DOI
10.1109/EPTC.2012.6507129
Filename
6507129
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