• DocumentCode
    2034613
  • Title

    Influence of electrode area on dielectric breakdown strength of thin poly(ethylene terephthalate) films [power capacitor applications]

  • Author

    Laihonen, S.J. ; Gafvert, U. ; Schutte, T. ; Gedde, U.W.

  • Author_Institution
    ABB Corp. Res., Vasteras, Sweden
  • fYear
    2004
  • fDate
    17-20 Oct. 2004
  • Firstpage
    563
  • Lastpage
    567
  • Abstract
    DC breakdown voltages of 8-20 μm thick poly(ethylene terephthalate) (PET) films were measured as a function of electrode area. The area of the measurement electrodes were between 0.045-9.3 cm2. Also 13-15 m2 capacitor elements were tested. Weibull distribution parameters, scale parameter α and shape parameter β, were fitted to the obtained breakdown strength data. Based on the small area results, short term breakdown strength of large area capacitor elements was predicted. Area extrapolation based on the scale parameter α was compared with Weibull extrapolation, in which also the shape of the distribution is taken into account. It was concluded that the Weibull extrapolation better represented the large area breakdown strength than the area extrapolation.
  • Keywords
    Weibull distribution; capacitors; electric breakdown; electric strength; electrodes; extrapolation; polyethylene insulation; polymer films; 8 to 20 micron; DC breakdown voltage electrode area dependence; PET films; Weibull distribution; Weibull extrapolation; breakdown strength; dielectric breakdown strength; electrode area; large area capacitor elements; power capacitors; scale parameter; shape parameter; thin poly(ethylene terephthalate) films; thin polymer films; Area measurement; Dielectric breakdown; Dielectric measurements; Dielectric thin films; Electric breakdown; Electrodes; Extrapolation; Positron emission tomography; Power capacitors; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
  • Print_ISBN
    0-7803-8584-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2004.1364312
  • Filename
    1364312