• DocumentCode
    2035561
  • Title

    The challenge of integrating magnetic nanostructures into functional 3-D devices

  • Author

    Sautner, J. ; Fields, J. ; Vavassori, P. ; Unguris, J. ; Metlushko, V.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    958
  • Lastpage
    960
  • Abstract
    Most magnetic nanostructures today are ultrathin or nanostructured films and multilayers. The key challenge for the future will be a suitable technology to integrate and to contact nanostructures in a reliable manner. Real devices are truly 3-dimensional structures, particularly where the roughness and shape of the contact lines influences a performance to such an extent that they modify the mechanism of operation. The topography must absolutely be taken into consideration during the design phase. This move towards non-flat device structures requires advanced fabrication, testing, and modeling in realistic 3-D geometries.
  • Keywords
    MRAM devices; magnetic multilayers; magnetic thin films; nanostructured materials; 3-dimensional structures; MRAM devices; functional 3-D devices; integrating magnetic nanostructures; multilayers; nanostructured films; nonflat device structures; ultrathin films; Fabrication; Geometry; Magnetic devices; Magnetic films; Magnetic multilayers; Nanostructures; Shape; Solid modeling; Surfaces; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
  • Conference_Location
    Torino
  • Print_ISBN
    978-1-4244-3385-8
  • Electronic_ISBN
    978-1-4244-3386-5
  • Type

    conf

  • DOI
    10.1109/ICEAA.2009.5297336
  • Filename
    5297336