BIST and boundary scan: a champion´s view

Reflecting on lessons learned from carrying the mantle of “Champion” for BIST and boundary scan technology for four years, I find the reasons for adoption of these methods to be somewhat different than I at first supposed. Nevertheless, BIST and boundary scan have made strong inroads, and I expect a rapid expansion of their application from this point forward. In the process, I believe that barriers will be breached which will encourage adoption of more aggressive built-in-quality strategies. The nature of these strategies can be to some extent be predicted by examining shortfalls in BIST and boundary scan as currently implemented