• DocumentCode
    2036664
  • Title

    Gas-source molecular beam epitaxy and a formulation for the growth control of a class of quaternary materials

  • Author

    Warnick, Sean C. ; Dahleh, Munther A.

  • Author_Institution
    Lab. for Inf. & Decision Syst., MIT, Cambridge, MA, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    10-12 Dec 1997
  • Firstpage
    820
  • Abstract
    Research in the control of gas-source molecular beam epitaxy (GSMBE) suggests that previous results for the growth of ternary III-V alloys via an alternative process, metal organic chemical vapor deposition (MOCVD), extend nicely to the problem of growing quaternary compounds of the form AxB1-xCyD1-y by GSMBE. In fact, the growth control problem for ternary compounds via MOCVD turns out to be embedded in the growth control problem for quaternary compounds via GSMBE. This is striking since the dynamics of MOCVD, which are linear, differ considerably from those of GSMBE, which are strongly nonlinear. Nevertheless, structure in the models can be exploited via an appropriate change of coordinates to facilitate controller design using linear design methodologies. Resulting controllers are shown to be robust with respect to parametric model uncertainty. The experimental setup of facilities under development is also discussed in light of future applications of this work
  • Keywords
    III-V semiconductors; chemical beam epitaxial growth; closed loop systems; control system synthesis; linear systems; process control; semiconductor device manufacture; semiconductor growth; closed loop systems; dynamics; gas-source molecular beam epitaxy; growth control; linear systems; metal organic chemical vapor deposition; process control; quaternary materials; ternary III-V alloys; Chemical processes; Chemical technology; Control systems; Gases; Indium phosphide; Laboratories; MOCVD; Molecular beam epitaxial growth; Production; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1997., Proceedings of the 36th IEEE Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-4187-2
  • Type

    conf

  • DOI
    10.1109/CDC.1997.650740
  • Filename
    650740