DocumentCode :
2036857
Title :
On generation of the minimum pattern set for data path elements in SoC design verification based on port order fault model
Author :
Wang, Chun-Yao ; Tung, Shing-Wu ; Jou, Jing-Yang
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2001
fDate :
2001
Firstpage :
145
Lastpage :
150
Abstract :
Embedded cores are being increasingly used in the design of large System-on-a-Chip. Because of the high complexity of SoC, the design verification is a challenge for system integrator To reduce the verification complexity, the port order fault model proposed by Tung and Jou (1998) has been used for verifying core-based designs and the corresponding verification pattern generation have been developed. Adders and multipliers are the most often used data path elements in core-based designs. Due to their regularity, the development of the verification pattern sets can be achieved in a systematic method. In this paper, we present the algorithms of generating the minimum verification pattern sets for adders and multipliers and these pattern sets are much smaller than that obtained from the automatic verification pattern generation proposed by Wang, Tung and Jou (2001)
Keywords :
automatic test pattern generation; embedded systems; formal verification; logic testing; adders; core-based designs; data path elements; minimum pattern set; minimum verification pattern sets; multipliers; port order fault model; system-on-a-chip design verification; verification complexity; verification pattern generation; Availability; Cost function; Councils; Data engineering; Design engineering; Design methodology; Manufacturing; System-on-a-chip; Testing; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Level Design Validation and Test Workshop, 2001. Proceedings. Sixth IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
0-7695-1411-1
Type :
conf
DOI :
10.1109/HLDVT.2001.972821
Filename :
972821
Link To Document :
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