DocumentCode :
2037649
Title :
Fast Blotch Detection Algorithm for Degraded Film Sequences Based on MRF Models
Author :
Nam, Sang-Churl ; Abe, Masahide ; Kawamata, Masayuki
Author_Institution :
Tohoku Univ., Sendai
Volume :
3
fYear :
2007
fDate :
Sept. 16 2007-Oct. 19 2007
Abstract :
This paper proposes a fast blotch detection algorithm based on a Markov random field (MRF) model with less computational load and with lower false alarm rate than the existing MRF-based algorithms. The proposed algorithm can save the computational time for detecting the blotches by restricting the attention of the detection process only to the candidate areas. The experimental results show that our proposed method provides the computational simplicity and an efficient detecting performance for the blotches.
Keywords :
Markov processes; image sequences; random processes; Markov random field model; degraded film sequences; false alarm rate; fast blotch detection algorithm; Computational efficiency; Degradation; Detection algorithms; Detectors; Image restoration; Markov random fields; Maximum likelihood detection; Motion detection; Object detection; Spatial coherence; Image restoration; image processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location :
San Antonio, TX
ISSN :
1522-4880
Print_ISBN :
978-1-4244-1437-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2007.4379371
Filename :
4379371
Link To Document :
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