DocumentCode :
2038028
Title :
A Markov random field for rectilinear structure extraction in pavement distress image analysis
Author :
Delagnes, Philippe ; Barba, Dominique
Author_Institution :
SEI-IRESTE, Nantes, France
Volume :
1
fYear :
1995
fDate :
23-26 Oct 1995
Firstpage :
446
Abstract :
This paper deals with the detection and extraction of poorly contrasted rectilinear structures in textured areas, using a Markov random field model. The application is in the analysis of pavement distress, and more particularly pavement cracks. A local crack detection is first performed, where the pavement texture is seen as additive correlated noise. The resulting line image is then projected onto a regular lattice composed of straight line segments. A graph structure is associated with this lattice, which allows the definition of a Markovian crack model, where sites are no longer the image pixels, but straight line segments. The model is used to determine the location and shape of the rectilinear structures, with a given orientation, in the observed lattice. The actual defects can then be extracted by simple post-processing
Keywords :
Markov processes; crack detection; edge detection; feature extraction; image segmentation; image texture; Markov random field model; Markovian crack model; additive correlated noise; graph structure; image pixels; image segmentation; line image; local crack detection; observed lattice; orientation; pavement cracks; pavement distress image analysis; pavement texture; postprocessing; rectilinear structure detection; rectilinear structure extraction; rectilinear structure location; rectilinear structure shape; regular lattice; straight line segments; Additive noise; Cameras; Image analysis; Image segmentation; Image texture analysis; Lattices; Markov random fields; Pixel; Roads; Surface cracks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 1995. Proceedings., International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-7310-9
Type :
conf
DOI :
10.1109/ICIP.1995.529742
Filename :
529742
Link To Document :
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