Burn-in elimination of a high volume microprocessor using IDDQ

For many years at this conference and others, I^DDQ has been a subject of much controversy involving its ability to enhance production test. While standard industry methods such as stuck-at functional testing and scan based testing are largely accepted by the global test community, I_DDQ testing continues to spark debate in the industry. This paper shows that I_DDQ testing is not only beneficial to production test, but also enabled the i960^RJX Microprocessor to ZOBI the standard production flow. ZOBI is an internal Intel term meaning `Zero Hour Burn In´ which will be explained further in a later section. This paper details the methodology employed for I_DDQ vector selection, tester manipulation, program flow, limits selection, and production qualification. The effect of I_DDQ on burn-in elimination and outgoing quality is demonstrated